Stand for studying the temperature dependence of the integral current sensitivity of photodetectors
https://doi.org/10.34680/2076-8052.2024.1(135).69-75
Abstract
A tested version of a test bench for studying the temperature dependence of the integrated current sensitivity of photodetectors is described. An original optical thermostat with a vertical beam path was used. This has made it possible to avoid the use of additional optical windows in the thermostat. Temperature control was carried out by a forward-biased emitter junction of a germanium transistor. The bias current was 100 μA. An experimental calibration of the temperature sensor was carried out in the range from 77 to 373 K. A blackbody model with a temperature of 800 K was used as a radiation source. Electrical circuits of the sensor and signal recorder for photodiodes are presented.
About the Authors
V. V. GavrushkoRussian Federation
Veliky Novgorod.
A. N. Grigoriev
Russian Federation
Veliky Novgorod.
O. R. Kadriev
Russian Federation
Veliky Novgorod.
References
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Review
For citations:
Gavrushko V.V., Grigoriev A.N., Kadriev O.R. Stand for studying the temperature dependence of the integral current sensitivity of photodetectors. Title in english. 2024;(1(135)):69-75. (In Russ.) https://doi.org/10.34680/2076-8052.2024.1(135).69-75